Manual probe stands

Height adjustable to cope with samples from thin layers to ingots. Lever operated probe with switched current leads to prevent sparking. Measures samples up to 10" deep. Width of sample limited only by need to support ends. Our most popular four point probe stand.

Ideal for probing small samples where high placement accuracy is required. The microposition table allows micro-manipulation of samples which are up to 76mm diameter. The sample can be retained in a vacuum if desired. Lever operated probe with switched current leads to prevent sparking.

All of the features of the Multiheight Probe Stand PLUS the added feature of a removable X-Y microposition table for micro-manipulation of small samples. When the slide is in use there is a 76mm diameter sample capacity, and the sample can be retained in a vacuum if desired.

Two different sizes of wafer table are available - either 200mm and 150mm. The measurement equipment has a repositioning accuracy within 1mm. There is a shrouded measuring area to minimize light and electrical interference. Lever operated probe with switched current leads to prevent sparking.

4-point measurement of wafer resistivity and 3-point spreading resistance measurements. Hinged steel cover to eliminate effects of light and electrical interference. Highly repeatable needle contact conditions. Individually adjustable needle loadings with direct indication of set load. Micrometer controlled X-Y stage for micromanipulation during measurement of samples.

An insulating PTFE body holding a Jandel cylindrical probe head. Allows for easy placement by hand, directly on top of the sample for measuring. Also enables measurement of large samples unable to fit on standard test equipment. The probe can be easily changed. Shorting switch to prevent sparking.