Jandel Multiheight / Microposition Probe Stand

Jandel Engineering Limited offers the Multiheight Probe stand with micrometer controlled X-Y stage as a solution for measurements on sample sizes from several mm square up to 300mm. The X-Y microposition table can be added when measurement of small samples is desired. With only four screws to undo it is easily removed, so that large samples up to 300mm diameter or ingots up to 250mm thick can be accommodated (thicker samples can be accommodated on request).

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    Max. sample sizeSamples up to 250mm diameter (300mm diameter option at no extra cost)
    Max. sample thicknessSamples up to 250mm high can be measured (higher on request)
    MicroswitchPrevents current flow when probe is not in contact with the sample
    Manual controlSimple lever operation for probe contact and removal
    Simple set upSingle wire connects the probe stand and electronics
    X-Y StageOffers micrometer controlled manipulation of small samples

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    Product FAQs

    Who is Jandel Engineering Ltd?
    Jandel Engineering was established in 1967. Prior to founding Jandel Engineering, Managing Director John Clark worked for A & M Fell in London. It was at this company that the first commercially available four point probe head, the 'Fell' probe head, was designed by John Clark and a colleague. Since this original design many improvements have been introduced.
    Why use Jandel probes?
    Jandel Probes offer the accuracy and perfection of more than 30 years experience. Tip radii and probe spacings are checked by interferometer and video inspection for certainty of accuracy. Spring loadings are checked by electronic force gauge. Unique Standard specifications include: 1) Upper and lower guides are jewelled 2) Solid tungsten carbide needles for superior durability and accuracy 3) Teflon insulation giving minimum leakage