Jandel Engineering Limited offers the Multiheight Probe stand as a solution for a wide variety of measurements. The probe mechanism can be raised and lowered
meaning that samples ranging in thickness from thin films to large ingots can be measured.
The Multiheight Probe is supplied with 4 mounting holes in the base which can accommodate optional mounting accessories such as an 8 inch wafer table or micropositioning X-Y stage.
Jandel Multiheight Four Point Probe Stand
| Specifications | |
|---|---|
| Max. sample size | Samples up to 250mm diameter (300mm diameter option at no extra cost) |
| Max. sample thickness | Samples up to 250mm high can be measured (higher on request) |
| Microswitch | Prevents current flow when probe is not in contact with the sample |
| Manual control | Simple lever operation for probe contact and removal |
| Simple set up | Single wire connects the probe stand and measurement electronics |
| Mounting holes | Optional sample tables are available |
Want to know more?
If you require any further information or have an enquiry contact us
Product FAQs
Who is Jandel Engineering Ltd?
Jandel Engineering was established in 1967. Prior to founding Jandel Engineering, Managing Director John Clark worked for A & M Fell in London. It was at this company that the first commercially available four point probe head, the 'Fell' probe head, was designed by John Clark and a colleague. Since this original design many improvements have been introduced.
Why use Jandel probes?
Jandel Probes offer the accuracy and perfection of more than 30 years experience. Tip radii and probe spacings are checked by interferometer and video inspection for certainty of accuracy. Spring loadings are checked by electronic force gauge.
Unique Standard specifications include:
1) Upper and lower guides are jewelled
2) Solid tungsten carbide needles for superior durability and accuracy
3) Teflon insulation giving minimum leakage