Jandel General Purpose System

Jandel Engineering Limited offers the RM3000+ Test Unit in combination with the Multiheight Probe stand as a solution for samples of various sizes and shape. This combination is by far the most popular combination of equipment sold by Jandel. The system can be used for measuring a wide variety of samples from thin layers and wafers up to ingots 250mm high (thicker samples can be accommodated on request).

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    Max. sample sizeSamples up to 250mm diameter (300mm diameter option available at no extra cost)
    Max. sample thicknessSamples up to 250mm thick can be measured (higher on request)
    MicroswitchPrevents current flow when probe is not in contact with the sample
    Manual controlSimple lever operation for probe contact and removal
    Simple set upSingle wire connects the probe stand and Jandel Test Units
    Measurement range1 mohm/square - 100 Megohms/square, 1 mohm.cm - 1 Megohm.cm
    RM3000+ unitsmV, ohm/square, ohm.cm (wafers), ohm.cm (volume)
    RM3000+ softwareFor operation and data control. Supplied free of charge

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    Product FAQs

    Who is Jandel Engineering Ltd?
    Jandel Engineering was established in 1967. Prior to founding Jandel Engineering, Managing Director John Clark worked for A & M Fell in London. It was at this company that the first commercially available four point probe head, the 'Fell' probe head, was designed by John Clark and a colleague. Since this original design many improvements have been introduced.
    Why use Jandel probes?
    Jandel Probes offer the accuracy and perfection of more than 50 years experience. Tip radii and probe spacings are checked by interferometer and video inspection for certainty of accuracy. Spring loadings are checked by electronic force gauge. Unique Standard specifications include: 1) Upper and lower guides are jewelled 2) Solid tungsten carbide needles for superior durability and accuracy 3) Teflon insulation giving minimum leakage
    Why are there so many different characteristics?
    Different users wish to probe different items, which means it is necessary to provide a wide range of characteristics. For instance someone wishing to measure a layer beneath an oxide would need sharp probes to penetrate the oxide layer, whereas a very thin metallic layer may require a much larger radius on the needles so that they do not puncture the layer. Similarly, some spacings are designed in order to help with the maths involved in working out resistivity, someone else may just require a very close spacing probe in order to fit all the probes on the sample.
    What model of probe should I use?
    Jandel has many different shaped probe heads. The best one for you depends entirely on your application and what machine (if any) you are using. Contact us with details of the probe you have now and we will let you know the best probe for you. Alternatively, if you wish to make a custom set up, we can help you to identify which probe will work best.