Jandel Multipurpose Four Point Probe System

The Multipurpose four point probe system is a combination of the Multiheight Probe Stand with the RM3000+ Test Unit, with the added feature of a removable X-Y microposition table. This combination allows a wide variety of samples to be measured from glass slides with TCOs or metal layers, to wafers and even ingots up to 250mm deep. For the smaller samples it is possible to locate the four point probe on precise locations by using micrometer controlled slides with the sample on top.

An optional longer post is available if taller samples are to be measured, and the base is available for measurement of samples up to 250mm diameter or as an option up to 300mm diameter.

The maximum sample size on the Micrometer controlled sample stage is 76mm diameter.

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    Max. sample sizeSamples up to 250mm diameter (300mm diameter option at no extra cost)
    Max. sample thicknessSamples up to 250mm high can be measured (higher on request)
    MicroswitchPrevents current flow when probe is not in contact with the sample
    Manual controlSimple lever operation for probe contact and removal
    Simple set upSingle wire connects the probe stand and RM3000+
    X-Y stageOffers micrometer controlled manipulation of small samples
    Measurement range1 mohm/square - 100 Megohms/square, 1 mohm.cm - 1 Megohm.cm
    RM3000+ unitsmV, ohm/square, ohm.cm (wafers), ohm.cm (volume)
    RM3000+ softwareFor operation and data control. Supplied free of charge

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    Product FAQs

    Who is Jandel Engineering Ltd?
    Jandel Engineering was established in 1967. Prior to founding Jandel Engineering, Managing Director John Clark worked for A & M Fell in London. It was at this company that the first commercially available four point probe head, the 'Fell' probe head, was designed by John Clark and a colleague. Since this original design many improvements have been introduced.
    Why use Jandel probes?
    Jandel Probes offer the accuracy and perfection of more than 30 years experience. Tip radii and probe spacings are checked by interferometer and video inspection for certainty of accuracy. Spring loadings are checked by electronic force gauge. Unique Standard specifications include: 1) Upper and lower guides are jewelled 2) Solid tungsten carbide needles for superior durability and accuracy 3) Teflon insulation giving minimum leakage
    Why are there so many different characteristics?
    Different users wish to probe different items, which means it is necessary to provide a wide range of characteristics. For instance someone wishing to measure a layer beneath an oxide would need sharp probes to penetrate the oxide layer, whereas a very thin metallic layer may require a much larger radius on the needles so that they do not puncture the layer. Similarly, some spacings are designed in order to help with the maths involved in working out resistivity, someone else may just require a very close spacing probe in order to fit all the probes on the sample.
    What model of probe should I use?
    Jandel has many different shaped probe heads. The best one for you depends entirely on your application and what machine (if any) you are using. Contact us with details of the probe you have now and we will let you know the best probe for you. Alternatively, if you wish to make a custom set up, we can help you to identify which probe will work best.