Datasheets

The General Purpose four point probe system is a combination of the Multiheight Probe Stand with the RM3000+ Test Unit. Height adjustable to cope with samples from thin layers to ingots. Lever operated probe with switched current leads to prevent sparking. Measures samples up to 10" deep. Width of sample limited only by need to support ends. Our most popular measurement system.

The Multipurpose four point probe system is a combination of the Multiheight Probe Stand with the RM3000+ Test Unit, with the added feature of a removable X-Y microposition table. This system can measure a wide variety of samples, from thin layers to ingots. The micrometer table allows precise locations to be measured. The maximum sample size on the removable Micrometer controlled sample stage is 76mm diameter.

The Wafer probing system is a combination of the Multiposition Probe Stand with the RM3000+ Test Unit. The wafer table is available in both 200mm and 150mm versions.

The portable probing system combines the Hand Applied Probe with the HM21 Test Unit. The system can be used for measuring a wide variety of samples from thin layers and wafers up to large ingots. The Hand Applied Probe has an insulating PTFE body which can be placed directly onto the sample to be measured.