Jandel Wafer probing system

Jandel Wafer probing four point probe system


The Wafer probing system is a combination of the Multiposition Probe Stand with the RM3000 Test Unit


The wafer table is avaiable in both 200mm and 150mm versions.

The probe is lever operated probe with switched current leads to prevent sparking.

The wafer table has cickable stops on the Y axis and at 90 degrees rotationally, with a repositioning accuracy within 1mm.

The measurement area is shielded from light

Download data sheet