Jandel four point probe systems

Below are the systems manufactured by Jandel Engineering Limited. Please go to the individual system pages for further information

Jandel General Purpose System

Four point probe system for measurement of a wide range of material and sample sizes, our most popular product

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Jandel Multipurpose System

Four point probe system for measurement of a wide range of material and sample sizes, with removable microposition table

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Jandel wafer probing system

Four point probe system for measurement of wafers up to 150mm or 200mm diameter with inbuilt light shield

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Jandel Portable System

Portable system with Hand Applied Probe

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Jandel system for ingots

Robust system for rough substrates

System for ingots