Jandel Multiheight Probe by Jandel Engineering Limited

Jandel Multiheight Probe

Height adjustable to cope with samples from thin layers to ingots.

Lever operated probe with switched current leads to prevent sparking.

Measures samples up to 10" deep.

Width of sample limited only by need to support ends.

A high resolution image of the Multiheight Probe can be seen here

<< Back to Test Equipment menu

Request a Quote

Request a quick quote for the Jandel Multiheight Probe: