PDF downloads on Jandel Engineering Limited products


Jandel four point probes

Jandel Cylindrical four point probe

The Jandel Cylindrical Probe head is suitable for use on Jandel equipment and equipment manufactured by Four Dimensions.
If required this probe is available with an adapter for use with equipment manufactured by the buyer.

Cylindrical probe data sheet

KLA-Tencor

Jandel Cartridge probe head with 6-way connector suitable for use on KLA / Tencor / Prometrix equipment.

Cartridge probe data sheet (KLA)

CDE ResMap

Jandel Cartridge probe head with 6-way connector suitable for use on CDE equipment.

Cartridge probe data sheet (CDE ResMap)

AIT

Jandel Miniature Cartridge Probe Head suitable for use on AIT (Advanced Instrument Technology) equipment.

Miniature Cartridge probe data sheet (AIT)

Napson

Jandel Miniature Cartridge Probe Head suitable for use on Kokusai equipment and early Napson equipment.

Miniature Cartridge probe data sheet (Napson)

Veeco

Jandel Cartridge with Lead for Magnetron, Veeco and Custom equipment.

Cartridge with lead data sheet

Napson

Jandel Cartridge Probe Head with 4-pin connector suitable for use on Napson equipment

Cartridge with 4-pin connector data sheet

Jandel Compact point probe

Jandel Compact probe is compatible with Alessi and Veeco machines

Compact probe data sheet

Jandel Test Units

RM3000

RM3000 Test Unit - our most comprehensive combined constant current source and voltmeter

RM3000 data sheet

HM21

HM21 Test Unit - portable combined constant current source and voltmeter with mains or battery power.

HM21 data sheet

Jandel ResTest

Jandel ResTest - new Test Unit with colour display and option to save results on board, via PC with free software provided or to memory stick

ResTest data sheet

Jandel measurement systems

Jandel General Purpose System

Four point probe system for measurement of a wide range of material and sample sizes, our most popular product

General Purpose System data sheet

Jandel Multipurpose System

Four point probe system for measurement of a wide range of material and sample sizes, with removable microposition table

Multipurpose System data sheet

Jandel wafer probing system

Four point probe system for measurement of wafers up to 150mm or 200mm diameter with inbuilt light shield

Multipurpose System data sheet

Jandel Portable System

Portable system with Hand Applied Probe

Portable System data sheet

Jandel system for ingots

Robust system for rough substrates

System for ingots data sheet

Jandel probe stands

Jandel Semi-Automatic Probe Stand

Automated z-axis verion of the Jandel Multiheight Probe Stand.
The base can accomodate wafers up to 300mm diameter (pictured)
Samples up to 250mm high can be probed - longer probe supports for deeper samples available on request
Simple probe contact and return via push buttons, with current flow instigated on probe contact
Compatible for operation via the Jandel RM3000 Test Unit

Jandel Semi-Automatic Probe Stand Data Sheet

Jandel Multiheight Four Point Probe Stand

Height adjustable to cope with samples from thin layers to ingots.
Lever operated probe with switched current leads to prevent sparking.
Measures samples up to 10" deep.
Width of sample limited only by need to support ends.
Our most popular four point probe stand

Jandel Multiheight Probe Stand data sheet

Jandel Multiheight/Microposition Probe Stand

All of the features of the Multiheight Probe Stand PLUS:
Removable X-Y Micro-manipulation slides for small samples.
76mm diameter sample capacity (when slides in use).
Sample can be retained by vacuum (when slides in use).

Jandel Multiheight/Microposition Probe Stand data sheet

Jandel Multiposition Wafer Probe Stand

200mm and 150mm versions available.
Lever operated probe with switched current leads to prevent sparking.
Repositioning accuracy within 1mm.
Shrouded measuring area to minimize light and electrical interference.

Jandel Multiposition Probe Stand data sheet

Jandel Universal Probe Stand

Highly repeatable needle contact conditions.
Individually adjustable needle loadings with direct indication of set load.
Micrometer controlled slice displacement.
4-point measurement of wafer resistivity and 3-point spreading resistance measurements.
Hinged steel cover to eliminate effects of light and electrical interference.

Jandel Universal Probe Stand data sheet

Jandel Hand Applied Probe

Insulating PTFE body.
4-point cylindrical probe head is easily changed.
Shorting switch to prevent sparking.
Easy placement by hand.
Measurement of large samples unable to fit on standard test equipment.

Jandel Hand Applied Probe data sheet

Other Jandel products

Jandel Reference Sample

Jandel Engineering offers an indium-tin-oxide (ITO) coated glass sample that can be used as a reference sample to assess whether a four point probing system is working properly.
The sample is not NIST traceable.
The sample is 50mm square with the assigned value applying to the 25mm squre central area of the sample.
These are only supplied in the 12.5 - 13.5 ohms/square range

Jandel Reference Sample Data Sheet

Jandel PN Typing Unit

Jandel Engineering offers a PN Typing Unit which works using the rectification method
Designed to work in conjunction with any of the Jandel Probe Stands

Jandel PN Unit Data Sheet

Jandel Light Shrouds

Jandel Engineering offers a removable plastic light shroud to shield light from samples up to 50mm diameter
Where light needs to be shielded from larger samples we offer a black cloth which prevents light penetrating. The cloth is made from Black velvet with a black cotton lining and can be draped over units while they are in operation to prevent light reaching the sample, and can also double as a dust cover for when the unit is not in use

Jandel Light Shrouds Data Sheet

Jandel Stability Shroud

For holding a probe head by hand Jandel Engineering offers a removable plastic stability shroud
The shroud fits over the end of the probe to give a large contact area so that more stability is offered while holding the probe in contact with a sample

Jandel Stability Shroud Data Sheet